Spectroscopic Ellipsometry - Inorganic Thin Films (EL+AS+EM+MS+TF-FrM)
Friday, Oct 22 2010 8:20AM, Room Cochiti
Moderated by: Mariadriana Creatore, Eindhoven University of Technology, the Netherlands
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8:20 AMEL+AS+EM+MS+TF-FrM-1Spectroscopic Ellipsometry Study on Transparent Conductive Ga-doped ZnO Thin Films Deposited by Ion-Plating with DC Arc Discharge
8:40 AMEL+AS+EM+MS+TF-FrM-2Spectroscopic Ellipsometry of Pulsed Laser Deposited ZnO on Atomic Layer Deposited Al2O3 and HfO2
9:00 AMEL+AS+EM+MS+TF-FrM-3Processing and Stability Studies of Vanadium Oxide Thin Films for Microbolometer Applications
9:20 AMEL+AS+EM+MS+TF-FrM-4Instrumentation of Far-infrared Mueller Matrix Ellipsometer and Its Application for Multiferroic Materials
9:40 AMEL+AS+EM+MS+TF-FrM-5Roughness beyond Bruggeman's Effective Medium Approximation
10:20 AMEL+AS+EM+MS+TF-FrM-7Spectroscopic Ellipsometry on Graphene
10:40 AMEL+AS+EM+MS+TF-FrM-8Free-charge Carrier Properties of Epitaxial Graphene by Terahertz and Infrared Ellipsometry
11:00 AMEL+AS+EM+MS+TF-FrM-9Mueller-Matrix Studies of Scarab Beetles using Spectroscopic Ellipsometry and Imaging Polarimetry
11:20 AMEL+AS+EM+MS+TF-FrM-10Agent-Free Bio-Chemical Sensing with Sculptured Thin Films
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