Spectroscopic Ellipsometry (EL+AS+EM+MS+TF-ThA)
Thursday, Oct 21 2010 2:00PM, Room Cochiti
Moderated by: Adriana Creatore, Eindhoven University of Technology
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2:00 PMEL+AS+EM+MS+TF-ThA-1Developments in Spectroscopic Ellipsometry for Characterization of Organic and Inorganic Surfaces, Interfaces and Complex Layered Materials
2:40 PMEL+AS+EM+MS+TF-ThA-3Characterizing the Adsorption – Desorption Behavior of Organic Molecules Within Thin Mesoporous Carbon Composite Films using Spectroscopic Ellipsometry
3:00 PMEL+AS+EM+MS+TF-ThA-4Mueller-Matrix Ellipsometry Studies of Chirality in Chitin-Based Structures and Thin Films of Al1-xInxN
3:40 PMEL+AS+EM+MS+TF-ThA-6Mueller Polarimetry as a Tool for the Evaluation of the Diffraction Grating Profile Asymmetry
4:00 PMEL+AS+EM+MS+TF-ThA-7Monitoring Ultra-Thin Organic Film Growth, In-Situ, with Combined Quartz Crystal Microbalance and Spectroscopic Ellipsometry
4:20 PMEL+AS+EM+MS+TF-ThA-8Ellipsometric Studies of Electronically Coupled PbSe and PbS Quantum Dot Thin Films
4:40 PMEL+AS+EM+MS+TF-ThA-9In-situ Temperature Measurements by Spectroscopic Ellipsometry: Application to a-Si based Thin Films
5:00 PMEL+AS+EM+MS+TF-ThA-10Real Time Spectroscopic Ellipsometry Studies of Amorphous and Nanocrystalline Si1-xGex:H Thin Films for Microbolometer Applications
5:20 PMEL+AS+EM+MS+TF-ThA-11Roll-to-Roll Fabrication of Thin Film Si:H Solar Cells: Real Time Monitoring and Post Deposition Mapping by Spectroscopic Ellipsometry
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