Graphene: Surface Characterization (GR+AS+TF+MI-ThA)
Thursday, Oct 21 2010 2:00PM, Room Brazos
Moderated by: Peter Sutter, Brookhaven National Laboratory
Abstracts (Use Expand/Collapse to see/hide details)
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2:00 PMGR+AS+TF+MI-ThA-1Scanning Tunneling Microscopy and Spectroscopy of Impurities on a Gated Graphene Device
2:40 PMGR+AS+TF+MI-ThA-3Graphene Defect States in a Magnetic Field Studied by Scanning Tunneling Spectroscopy
3:00 PMGR+AS+TF+MI-ThA-4Atomic-Scale Maps of Quantum Hall States in Epitaxial Graphene
3:40 PMGR+AS+TF+MI-ThA-6Imperfect Graphene: Point Defects, Edges, Dislocations and Grain Boundaries
4:20 PMGR+AS+TF+MI-ThA-8Spectroscopic Ellipsometry for Thickness Measurement and Optical Dispersion Modeling of CVD-Grown Graphene
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