AVS1998 Electronic Materials and Processing Division Sessions
Topics | Time Periods | Schedule Overview
Click a Session Code to view its Abstracts
| Session Code | Start | Session Name |
|---|---|---|
| EM-MoM | Monday, November 2, 1998 8:20 AM | Processing for Advanced Technology |
| EM-MoA | Monday, November 2, 1998 2:00 PM | Future Issues in Electronics and Photonics |
| EM+SE-TuM | Tuesday, November 3, 1998 8:20 AM | Critical Issues in Widebandgap Semiconductors |
| EM+PS+SE-TuA | Tuesday, November 3, 1998 2:00 PM | Plasma Processing of Compound Semiconductors |
| EM-WeM | Wednesday, November 4, 1998 8:20 AM | Fundamentals of Si Cleaning and CMP |
| EM1-WeA | Wednesday, November 4, 1998 2:00 PM | Si Surface Chemistry |
| EM2-WeA | Wednesday, November 4, 1998 2:00 PM | Application of Scanning Probes to Electronic Materials |
| EM+PS-ThM | Thursday, November 5, 1998 8:20 AM | Processing of High K Dielectrics for DRAMs |
| EM-ThM | Thursday, November 5, 1998 8:20 AM | Compound Semiconductor Surface Chemistry |
| EM1-ThA | Thursday, November 5, 1998 2:00 PM | Dielectrics |
| EM2-ThA | Thursday, November 5, 1998 2:00 PM | Non-destructive Testing and In-situ Diagnostics |
| EM-ThP | Thursday, November 5, 1998 5:30 PM | Electronic Materials and Processing Poster Session |
| EM-FrM | Friday, November 6, 1998 8:20 AM | Fabrication and Characterization of Semiconductor Device Layers |