AVS1999 FrM Sessions , Friday, October 29, 1999 8:20 AM

Friday Morning

Abstract Timeline | Time Periods | Topics | Schedule Overview

Click a Session Code to view its Abstracts
Session Code Topic Session Name
AS-FrM AS New or Improved Surface Related Analytical Techniques
BI-FrM BI Interface, Properties, and Modification
EM-FrM EM In Situ Monitoring and Growth
MI-FrM MI Magnetic Thin Films
MS+PS-FrM NS Diagnostics and Processes in Etching
NT+NS+EM+MS-FrM NT Nanotubes: Growth, Characterization and Properties II
PS-FrM PS Emerging Plasma Applications
SS1+AS+BI-FrM SS Organic Films/Self-Assembled Monolayers
SS2-FrM SS Adsorption on Metals and Silicon
SS3+EM-FrM SS Reactions on Semiconductors
TF-FrM TF In-situ Characterization and Material Process Imaging
VT-FrM VT Vacuum Systems, Design, and Engineering
Abstract Timeline | Time Periods | Topics | Schedule Overview