AVS2012 WeA Sessions , Wednesday, October 31, 2012 2:00 PM
Wednesday Afternoon
Abstract Timeline | Time Periods | Topics | Schedule Overview
Click a Session Code to view its Abstracts
| Session Code | Topic | Session Name |
|---|---|---|
| AS+NS+SS+TF-WeA | AS | 3D Imaging & Nanochemical Analysis - Part 2 (2:00-3:20 pm)/ Advanced Data Analysis and Instrument Control (4:00-6:00 pm) |
| BN+AS-WeA | BN | Bioimaging |
| EM+OX-WeA | EM | Oxides and Dielectrics for Novel Devices and Ultra-dense Memory |
| EN+TF-WeA | EN | Thin Films for Energy Applications |
| EW-WeA | EW | Exhibitor Technology Spotlight |
| GR+AS+EM+NS+SS-WeA | GR | Dopants and Defects in Graphene; Graphene Interfaces with Other Materials |
| HI+AS+NS-WeA | HI | Basics of Helium Ion Microscopy |
| LB+EM+GR+MN+TR-WeA | LB | Select Topics in Surface and Interface Science |
| MI+OX-WeA | MI | Spintronics, Magnetoelectrics, Multiferroics |
| NS-WeA | NS | Nanophotonics and Plasmonics |
| PS1-WeA | PS | Plasma Diagnostics, Sensors and Control 2 |
| PS2-WeA | PS | Plasma Surface Interactions during PECVD and Plasma Surface Modification |
| SP+AS+BI+ET+MI+TF-WeA | SP | Emerging Instrument Formats |
| SS+EM-WeA | SS | Semiconductor Surfaces |
| SS-WeA | SS | Catalysis on Metals and Alloys |
| TC+EM+AS-WeA | TC | Printable and Flexible Electronics |
| TF+AS-WeA | TF | Thin Films: Growth and Characterization-I |
| TF+MI-WeA | TF | Thin Films for Memory and Data Storage |