ICMCTF1999 Coating and Thin Film Characterization Sessions

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Session Code Start Session Name
F3- Monday, April 12, 1999 8:30 AM Surface and Thin Film Analysis
F3-2- Monday, April 12, 1999 1:30 PM Surface and Thin Film Analysis
F4- Tuesday, April 13, 1999 1:30 PM Microstructural, Microanalytical and Imaging Characterization
FP- Tuesday, April 13, 1999 5:00 PM FP Posters
F5- Wednesday, April 14, 1999 8:30 AM Characterization of Thin Film Growth Processes and Evolving Film Properties
F2- Wednesday, April 14, 1999 1:30 PM Nondestructive and In-situ Characterization
F1/E4- Thursday, April 15, 1999 8:30 AM Mechanical Properties and Adhesion
F1/E4-2- Thursday, April 15, 1999 1:30 PM Mechanical Properties and Adhesion
Topics | Time Periods | Schedule Overview